75691 Electron Microscopy Sciences JEOL Aluminum SEM Mount, 25 mm x 12.7 mm

Description

This JEOL Aluminum SEM Mount from Electron Microscopy Sciences is designed for use with JEOL SEM instruments. Constructed from durable aluminum, it offers a reliable platform for sample preparation and analysis. The mount features dimensions of 25 mm by 12.7 mm, providing ample space for various sample sizes. It is engineered to ensure secure sample placement during electron microscopy examinations.

• Constructed from aluminum for durability.
• Designed for JEOL SEM instruments.
• Dimensions: 25 mm x 12.7 mm.

Enhance your electron microscopy workflow with this high-quality SEM mount.