Description
This standard pin stub SEM mount features a slotted head design, crafted from aluminum for durability and conductivity. It is specifically engineered to hold samples for Scanning Electron Microscopy (SEM) applications, utilizing a 1/2″ (12.7mm) pin stub system. This mount is a reliable choice for researchers requiring precise sample positioning and stability during microscopic analysis.
- Constructed from aluminum for optimal performance.
- Features a slotted head for secure sample mounting.
- Designed for use with standard 1/2″ (12.7mm) pin stubs.
Enhance your microscopy workflow with this essential specimen mount!
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