67981-26 Electron Microscopy Sciences NE71 Index Pattern Grid, 26mm, 0.5mm Squares

Description

The Electron Microscopy Sciences NE71 Indexed Grid Graticule is designed for precise measurement and calibration in microscopy applications. This specific model features an NE71 index pattern with a 20×20 grid layout, composed of 0.5mm squares, all within a 26mm diameter. Manufactured by Electron Microscopy Sciences, it ensures reliable performance for detailed analysis in scientific research and laboratory settings.

• Features an NE71 index pattern for clear referencing.
• Grid consists of 20×20 squares, each measuring 0.5mm.
• Total diameter of the graticule is 26mm.
• Designed for use in electron microscopy and other high-precision imaging.

Enhance your microscopy workflow with this essential calibration tool!