Description
This carbon planchet is specifically designed for Scanning Electron Microscopy (SEM) applications. Manufactured by Electron Microscopy Sciences, it offers a reliable substrate for sample mounting. The planchet features a 25.4 mm diameter surface and a height of 1.6 mm, providing a stable platform for various specimen types. Its carbon composition is ideal for minimizing interference in SEM imaging.
- Designed for SEM applications
- Durable carbon construction
- Standard 25.4 mm diameter
Enhance your SEM analysis with this high-quality carbon planchet.
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