80074-SI Electron Microscopy Sciences MAC X-Ray Microanalysis Silicon Single Standard

Description

The MAC X-ray elemental reference standards from Electron Microscopy Sciences are designed for energy dispersive or wavelength dispersive X-ray microanalysis. This specific standard is a Silicon Single, identified by the catalog number 80074-Si. It is part of a comprehensive line of elemental reference materials crucial for accurate material analysis in scientific research and industrial applications.

• Elemental reference standard for X-ray microanalysis.
• Features Silicon in a single standard format.
• Manufactured by Electron Microscopy Sciences.

Explore the precision of MAC X-Ray Microanalysis standards for your critical applications!