75830-20 Electron Microscopy Sciences JEOL SEM Mount, 25 x 20 mm

Description

This JEOL SEM Mount from Electron Microscopy Sciences is constructed from standard aluminum, designed for use with JEOL scanning electron microscopes. It measures 25 mm by 20 mm, providing a reliable platform for sample preparation and analysis in microscopy applications. The mount is engineered to meet the rigorous demands of electron microscopy, ensuring consistent performance.

• Standard Aluminum Construction
• Designed for JEOL SEMs
• Dimensions: 25 mm x 20 mm

Upgrade your microscopy workflow with this essential SEM mount.