Description
This Aluminum/Nickel Tape from Electron Microscopy Sciences is designed for critical applications in electron microscopy. It features a specialized construction with a 0.035 mm pad and a 0.040 mm adhesive layer, ensuring reliable conductivity and adhesion. The tape is specifically formulated to meet the demanding requirements of SEM sample preparation, providing a high-quality solution for researchers and technicians.
- Conductive Aluminum/Nickel Tape
- 0.035 mm Pad thickness
- 0.040 mm Adhesive thickness
- Ideal for SEM applications
Enhance your microscopy workflow with this essential conductive tape.
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