68047-CERT Electron Microscopy Sciences Traceable Calibration Standards, 2 x 0.5 mm Slot, NPL Certification

Description

This product from Electron Microscopy Sciences offers traceable calibration standards designed for electron microscopy applications. It features two slots, each measuring 0.5 mm, and includes NPL certification for Si PS70. These standards are engineered to ensure accuracy and reliability in critical calibration processes within scientific research environments.

• Traceable calibration standards
• Includes NPL certification for Si PS70
• Designed for electron microscopy applications

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