Description
This SEM mount, identified by MPN 75183, is constructed from aluminum and features a slotted head design. It is engineered for compatibility with a wide range of scanning electron microscopes, including models from FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan, and Camscan. This specimen mount is designed to securely hold samples for analysis in these advanced microscopy systems.
- Constructed from durable aluminum.
- Features a slotted head for sample placement.
- Compatible with major SEM brands and models.
Explore our selection of high-quality SEM specimen mounts to enhance your microscopy workflow.






Reviews
There are no reviews yet.