75200 Electron Microscopy Sciences Standard Pin Stub SEM Mount Slotted Head

Description

This standard pin stub SEM mount features a slotted head and is constructed from aluminum. It is designed for use with Cambridge, Leo, and Philips SEM systems, and is compatible with FIB sample mounting on a standard 1/2″ (12.7mm) pin stub. The mount includes an 8 mm pin with a 1/8″ pin diameter, measuring 3.1 mm x 11 mm long.

• Constructed from durable aluminum.
• Features a slotted head for secure sample mounting.
• Compatible with various SEM systems including Cambridge, Leo, and Philips.
• Designed for FIB sample preparation.

Order the Electron Microscopy Sciences Standard Pin Stub SEM Mount today!