75236 Electron Microscopy Sciences Standard Pin Stub SEM Mount, Slotted 1/2″ Head

Description

The Standard Pin Stub SEM Mount with Slotted 1/2″ Head is designed for specimen mounting in scanning electron microscopy. This mount features a slotted head for secure sample placement and is compatible with standard 1/2″ (12.7mm) pin stubs, making it suitable for applications such as FIB sample mounting. It is constructed from polished aluminum for durability and optimal performance in microscopy applications.

• Compatible with standard 1/2″ pin stubs
• Slotted head for secure sample mounting
• Constructed from polished aluminum
• Suitable for FIB sample mounting

Enhance your microscopy workflow with this reliable specimen mount.