Description
This aluminum SEM mount is specifically designed for the JEOL JSM-840 scanning electron microscope. It features a standard aluminum construction ensuring durability and reliable performance in microscopy applications. The mount is engineered to precise dimensions for optimal sample placement and analysis.
- Standard aluminum construction
- Designed for JEOL JSM-840 SEM
- Precise dimensions for sample mounting
Enhance your microscopy workflow with this essential SEM accessory.
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