75722 Electron Microscopy Sciences JEOL JSM 840 SEM Mount, 25 x 10 mm, Aluminum

Description

This SEM mount is specifically designed for the JEOL JSM-840 scanning electron microscope. Constructed from machined aluminum, it features dimensions of 25 x 10 mm, providing a reliable platform for sample preparation and analysis. The mount is engineered to ensure secure placement of specimens within the microscope chamber, facilitating high-quality imaging and data acquisition. Its robust construction and precise dimensions make it an essential accessory for researchers in microscopy and materials science.

• Machined aluminum construction for durability.
• Designed for JEOL JSM-840 SEM.
• Dimensions: 25 x 10 mm.

Enhance your microscopy workflow with this essential SEM mount.