Description
This aluminum mount is specifically designed for the JEOL JSM 840 scanning electron microscope. It features a standard aluminum construction and precise dimensions of 31.5 mm in diameter and 20 mm in height, ensuring compatibility and optimal performance within the microscope’s sample stage. Manufactured by Electron Microscopy Sciences, this mount is a reliable component for sample preparation and analysis in microscopy applications.
- Standard aluminum construction
- Designed for JEOL JSM 840 SEM
- Precise dimensions for secure sample placement
Enhance your microscopy workflow with this essential JEOL JSM 840 aluminum mount.






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