Description
This JEOL SEM Mount from Electron Microscopy Sciences is designed for use with JEOL scanning electron microscopes. It features a 1 1/4 inch (32mm) diameter head and a height of 3/8 inch (10mm). This specific model, 75830-80, is part of a range of SEM mounts offered by the manufacturer, with different packaging quantities available for various laboratory needs. It is constructed from aluminum, ensuring durability and compatibility with SEM sample preparation workflows.
- Designed for JEOL SEM systems
- Durable aluminum construction
- Standard head and height dimensions for sample mounting
Enhance your microscopy workflow with this reliable SEM mount.






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