75830-90 Electron Microscopy Sciences SEM Mount, JEOL, 32 x 10 mm

Description

This SEM mount from Electron Microscopy Sciences is specifically designed for JEOL SEM instruments. It features a 32 mm diameter and a 10 mm height, providing a robust platform for sample preparation and analysis. Engineered for compatibility with JEOL systems, this mount ensures reliable performance in electron microscopy applications.

• Designed for JEOL SEM instruments
• Durable construction for sample integrity
• Precise dimensions for secure sample placement

Enhance your microscopy workflow with this essential SEM mount.