Description
The TIN-C Test Specimen on JEOL STUB is a specialized calibration standard manufactured by Electron Microscopy Sciences. Designed for use with JEOL scanning electron microscopes (SEM), this specimen aids in the calibration and verification of instrument performance. It features a Tin-C material mounted on a standard JEOL pin stub for easy integration into the microscope’s sample holder.
- High-quality calibration standard for JEOL SEMs
- Features Tin-C material for accurate testing
- Mounted on a 12.5mm JEOL pin stub
- Each unit is individually packaged
Ensure precise instrument calibration with this reliable test specimen.
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