80111-31M Electron Microscopy Sciences Magnification Reference Standard, Model 301BE, Parallel Ridges

Description

This Magnification Reference Standard, identified by MPN 80111-31M and Model 301BE, is designed for calibration in Scanning Probe Microscopy (SPM), Atomic Force Microscopy (AFM), and Scanning Electron Microscopy (SEM) applications. It features parallel ridges and is presented in a mounted configuration, ensuring precise and reliable measurements for advanced microscopy techniques. Manufactured by Electron Microscopy Sciences, this standard is a crucial tool for ensuring accuracy in submicron analysis.

• Features parallel ridges for precise calibration.
• Mounted configuration for ease of use in microscopy.
• Suitable for SPM, AFM, and SEM applications.
• Manufactured by Electron Microscopy Sciences.

Enhance your microscopy workflow with this essential calibration standard!